November_EDFA_Digital

ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 20 NO. 4 42 device failure analysis industry. EDFAS PRESIDENT’S AWARD EDFAS AWARDS SEEKING NOMINATIONS FOR EDFAS AWARDS The ASM Electronic Device Failure Analysis Society established two awards to recognize the accomplishments of its members. The awards will be given at ISTFA 2019. Nominate a worthy colleague today! EDFAS LIFETIME ACHIEVEMENT AWARD The EDFAS Lifetime Achievement Award was established by the EDFAS Board of Directors in 2015 to recognize leaders in the EDFAS community who have devoted their time, knowledge, and abilities to the advancement of the electronic The EDFAS President’s Award shall recognize exceptional service to EDFAS and the electronic device failure analysis community. Examples of such service include, but are not limited to, committee service, service on the Board of Directors, organization of conferences or symposia, development of education courses, and student and general public outreach. While any member of EDFAS is expected to further the Society’s goals through service, this award shall recognize those who provided an exceptional amount of effort in their service to the Society. Nomination deadline for both awards is March 1, 2019. For rules and nomination forms, visit the EDFAS website at edfas.org, click on Membership & Networking and then Society Awards, or contact Mary Anne Jerson at 440.338.5151, maryanne.jerson@asminternational.org.

NOTEWORTHY NEWS

2019 IRPS CONFERENCE The IEEE International Reliability Physics Symposium’s (IRPS) annual conference will be held March 31 to April 4, 2019, at the Hyatt Regency in Monterey, Calif.

The IRPS technical program includes technical sessions, keynotes and invited talks on emerging issues, tutorials, workshops, poster sessions, a year-in-review seminar, and equipment demonstrations. Special attention is given to the reliability of advanced CMOS scaling, new materials introduction, new processes or integration strategies, and/or fun- damentally new device architectures. Attendees returning from IRPS will be better equipped to solve critical reliability problems and develop effective qualification procedures that affect their company’s bottom line. The IRPS Conference is sponsored by the IEEE Reliability Society and IEEE Electron Devices Society. The 2019 event will be held jointly with the International Electrostatic Discharge Workshop (IEW). For more information, visit the IRPS website at irps.org.

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